S-parameter resonance method for the calibration of standard capacitors

Author

Özkan, Turgay ; Gülmez, Gülay ; Gülmez, Yakup ; Turhan, Enis ; Neli, N. Berna Te

Author_Institution

TUBITAK Ulusal Metroloji Enstitusu, Gebze, Turkey

fYear

2012

fDate

1-6 July 2012

Firstpage

692

Lastpage

693

Abstract

National Metrology Institute of Turkey (TÜBİTAK UME) has developed a new approach for the characterization of Agilent 16380A-type four-terminal-pair (4TP) air dielectric capacitance standards in the range of 1 pF to 1000 pF up to 30 MHz. This method is based on determining all residual inductive parameters of 4TP standard air dielectric capacitors from resonance frequencies. These resonance frequencies were calculated using impedance and admittance values obtained from scattering parameter measurements up to 500 MHz employing a vector network analyzer. Capacitive residual parameters were measured by using a 1 kHz capacitance bridge.

Keywords

S-parameters; calibration; capacitance measurement; capacitors; network analysers; 4TP standard air dielectric capacitor; Agilent 16380A-type 4TP; Agilent 16380A-type four-terminal-pair; National Metrology Institute of Turkey; S-parameter resonance method; TÜBİTAK UME; air dielectric capacitance standard; calibration; capacitance 1 pF to 1000 pF; capacitive residual parameter measurement; frequency 1 kHz; residual inductive parameter; resonance frequency; scattering parameter measurement; vector network analyzer; Capacitance; Equations; Frequency measurement; Mathematical model; Resonant frequency; Scattering parameters; Standards; Capacitance calibration; four-terminal pair; frequency dependence; resonance; scattering parameter;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6251118

Filename

6251118