DocumentCode
2753616
Title
Low current and low voltages-the high-end op amp testing challenge
Author
Cometta, Bob ; Witte, Jan
Author_Institution
Burr-Brown Corp., Tucson, AZ, USA
fYear
1997
fDate
1-6 Nov 1997
Firstpage
796
Lastpage
801
Abstract
State-of-the-art op amps with input bias currents in the fA range and offset voltages of several μV present special test problems. The authors discuss the measurement problems and their possible solutions. The topics discussed include: DSP based input bias current measurement; leakage current compensation; and current loop feedback
Keywords
automatic test equipment; automatic testing; electric current measurement; feedback amplifiers; leakage currents; operational amplifiers; DSP; current loop feedback; fA range; input bias current measurement; input bias currents; leakage current compensation; offset voltages; operational amplifier testing; Circuit testing; Fixtures; Hardware; Insulation; Leakage current; Low voltage; Operational amplifiers; Relays; Sockets; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639693
Filename
639693
Link To Document