DocumentCode
275414
Title
Extension of the critical path tracing algorithm
Author
Ramakrishnan, T. ; Kinney, L.
Author_Institution
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear
1990
fDate
24-28 Jun 1990
Firstpage
720
Lastpage
723
Abstract
Critical path tracing (CPT) is an approximate algorithm used for fast fault simulation, as part of test generation algorithms. It partitions the circuit to be simulated into fanout free regions in order to simplify decisions regarding the propagation of logic signal changes through the circuit. Presented are concepts that result in faster decision making than in CPT for many combinations of input changes. After true value simulation, improved critical path tracing (ICPT) does a more extensive classification of lines than CPT does. This finer classification determines propagation of fault effects without fault simulation in many cases where CPT may require fault simulation. The increase in execution time to incorporate the improvements is insignificant compared to the savings in simulation time for many input vectors
Keywords
logic testing; CPT; critical path tracing; fast fault simulation; fault effects; improved critical path tracing; test generation; Circuit faults; Circuit simulation; Circuit testing; Costs; Dictionaries; Electrical fault detection; Logic circuits; Logic design; Logic gates; Partitioning algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
Conference_Location
Orlando, FL
ISSN
0738-100X
Print_ISBN
0-89791-363-9
Type
conf
DOI
10.1109/DAC.1990.114947
Filename
114947
Link To Document