• DocumentCode
    275414
  • Title

    Extension of the critical path tracing algorithm

  • Author

    Ramakrishnan, T. ; Kinney, L.

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    1990
  • fDate
    24-28 Jun 1990
  • Firstpage
    720
  • Lastpage
    723
  • Abstract
    Critical path tracing (CPT) is an approximate algorithm used for fast fault simulation, as part of test generation algorithms. It partitions the circuit to be simulated into fanout free regions in order to simplify decisions regarding the propagation of logic signal changes through the circuit. Presented are concepts that result in faster decision making than in CPT for many combinations of input changes. After true value simulation, improved critical path tracing (ICPT) does a more extensive classification of lines than CPT does. This finer classification determines propagation of fault effects without fault simulation in many cases where CPT may require fault simulation. The increase in execution time to incorporate the improvements is insignificant compared to the savings in simulation time for many input vectors
  • Keywords
    logic testing; CPT; critical path tracing; fast fault simulation; fault effects; improved critical path tracing; test generation; Circuit faults; Circuit simulation; Circuit testing; Costs; Dictionaries; Electrical fault detection; Logic circuits; Logic design; Logic gates; Partitioning algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0738-100X
  • Print_ISBN
    0-89791-363-9
  • Type

    conf

  • DOI
    10.1109/DAC.1990.114947
  • Filename
    114947