• DocumentCode
    2756116
  • Title

    Design of microprocessors with built-in on-line test

  • Author

    Leveugle, R. ; Michel, T. ; Saucier, G.

  • Author_Institution
    Inst. Nat. Polytech. de Grenoble/CSI, France
  • fYear
    1990
  • fDate
    26-28 June 1990
  • Firstpage
    450
  • Lastpage
    456
  • Abstract
    Control flow checking techniques are discussed. Invariant properties of the control flow can be checked at two different levels: verification of the sequencing in the controller of the microprocessor or verification of the control flow in the application program. Control flow checking has been implemented, at the two levels, in different versions of a 32-b microprocessor designed in a CMOS 1.5- mu technology. Integration of the monitors on silicon is detailed. The silicon overhead due to the different online test devices is precisely discussed. Different versions of this microprocessor have been designed and implemented in order to make real cost comparisons on components with identical functionality but different integrated monitors. Here only the hardware cost of concurrent checking is considered.<>
  • Keywords
    CMOS integrated circuits; built-in self test; microprocessor chips; 1.5 micron; 32 bit; CMOS; application program; built-in on-line test; control flow checking; microprocessors; sequencing; silicon; verification; CMOS technology; Compaction; Controllability; Costs; Hardware; Microprocessors; Monitoring; Observability; Read only memory; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1990. FTCS-20. Digest of Papers., 20th International Symposium
  • Conference_Location
    Newcastle Upon Tyne, UK
  • Print_ISBN
    0-8186-2051-X
  • Type

    conf

  • DOI
    10.1109/FTCS.1990.89381
  • Filename
    89381