DocumentCode
2756116
Title
Design of microprocessors with built-in on-line test
Author
Leveugle, R. ; Michel, T. ; Saucier, G.
Author_Institution
Inst. Nat. Polytech. de Grenoble/CSI, France
fYear
1990
fDate
26-28 June 1990
Firstpage
450
Lastpage
456
Abstract
Control flow checking techniques are discussed. Invariant properties of the control flow can be checked at two different levels: verification of the sequencing in the controller of the microprocessor or verification of the control flow in the application program. Control flow checking has been implemented, at the two levels, in different versions of a 32-b microprocessor designed in a CMOS 1.5- mu technology. Integration of the monitors on silicon is detailed. The silicon overhead due to the different online test devices is precisely discussed. Different versions of this microprocessor have been designed and implemented in order to make real cost comparisons on components with identical functionality but different integrated monitors. Here only the hardware cost of concurrent checking is considered.<>
Keywords
CMOS integrated circuits; built-in self test; microprocessor chips; 1.5 micron; 32 bit; CMOS; application program; built-in on-line test; control flow checking; microprocessors; sequencing; silicon; verification; CMOS technology; Compaction; Controllability; Costs; Hardware; Microprocessors; Monitoring; Observability; Read only memory; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1990. FTCS-20. Digest of Papers., 20th International Symposium
Conference_Location
Newcastle Upon Tyne, UK
Print_ISBN
0-8186-2051-X
Type
conf
DOI
10.1109/FTCS.1990.89381
Filename
89381
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