• DocumentCode
    2757344
  • Title

    System Level Hardening by Computing with Matrices

  • Author

    Ferreira, Ronaldo R. ; Moreira, Álvaro F. ; Carro, Luigi

  • Author_Institution
    Inst. de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
  • fYear
    2010
  • fDate
    1-3 Sept. 2010
  • Firstpage
    373
  • Lastpage
    379
  • Abstract
    Continuous advances in transistor manufacturing have enabled technology scaling along the years, sustaining Moore´s law. As transistors sizes rapidly shrink, and voltage scales, the amount of charge in a node also rapidly decreases. A particle hitting the core will probably cause a transient fault to spam over several clock cycles. In this scenario, embedded systems using state-of-the-art technologies will face the challenge of operating in an environment susceptible to multiple errors, but with restricted resources available to deploy fault-tolerance, as these techniques severely increase power consumption. One possible solution to this problem is the adoption of software based fault-tolerance at the system level, aiming at reduced energy levels to ensure reliability and low energy dissipation. In this paper, we claim the detection and correction of errors on generic data structures at system level by using matrices to encode any program and algorithm. With such encoding, it is possible to employ established techniques of detection and correction of errors occurring in matrices, running with inexpressive overhead of power and energy. We evaluated this proposal using two case studies significant for the embedded system domain. Using the proposed approach, we observed in some cases an overhead of only 5% in performance and 8% in program size.
  • Keywords
    data structures; embedded systems; matrix algebra; software fault tolerance; Moore´s law; embedded systems; fault tolerance; generic data structures; low energy dissipation; matrices; power consumption; software based fault-tolerance; system level hardening; technology scaling; transient fault; transistor manufacturing; Equations; Fault tolerance; Fault tolerant systems; Fingerprint recognition; Heuristic algorithms; Software; Transient analysis; embedded systems; fault-tolerance; fingerprinting; hardening; matrix analysis; transient faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design: Architectures, Methods and Tools (DSD), 2010 13th Euromicro Conference on
  • Conference_Location
    Lille
  • Print_ISBN
    978-1-4244-7839-2
  • Type

    conf

  • DOI
    10.1109/DSD.2010.8
  • Filename
    5615587