DocumentCode
2758008
Title
A reliability integrated acceptance test plan for series systems whose components following exponential distributions
Author
Li, Xue-jing ; Yu, Dan
Author_Institution
Coll. of Appl. Sci., Beijing Univ. of Technol., Beijing, China
fYear
2011
fDate
10-12 July 2011
Firstpage
339
Lastpage
344
Abstract
For the series systems whose components follow the exponential distribution, we put forward the reliability integrated acceptance test plan based on the components´ information. Finally, we will provide a simulation example to demonstrate our method.
Keywords
exponential distribution; reliability theory; testing; component information; exponential distributions; reliability integrated acceptance test plan; series systems; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligence and Security Informatics (ISI), 2011 IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4577-0082-8
Type
conf
DOI
10.1109/ISI.2011.5984110
Filename
5984110
Link To Document