• DocumentCode
    2758343
  • Title

    ADOLT-An ADaptable On-Line Testing scheme for VLSI circuits

  • Author

    Maamar, A. ; Russell, G.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
  • fYear
    1999
  • fDate
    9-12 March 1999
  • Firstpage
    770
  • Lastpage
    771
  • Abstract
    ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of area overheads and the effect on performance. The scheme uses a slightly modified version of Dong´s code [1982] and gives a more efficient implementation than previous methods.
  • Keywords
    VLSI; automatic testing; design for testability; error detection; integrated circuit testing; ADOLT; CED scheme; Dong´s code; VLSI circuits; adaptable on-line testing scheme; area overheads; error detection capabilities; Circuit testing; Decision support systems; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
  • Conference_Location
    Munich, Germany
  • Print_ISBN
    0-7695-0078-1
  • Type

    conf

  • DOI
    10.1109/DATE.1999.761223
  • Filename
    761223
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2758343