• DocumentCode
    2759300
  • Title

    The mechanism of clearing in metalized film capacitors

  • Author

    Qin, Shanshan ; Ma, Shilei ; Boggs, Steven A.

  • Author_Institution
    Inst. of Mater. Sci., Univ. of Connecticut, Storrs, CT, USA
  • fYear
    2012
  • fDate
    10-13 June 2012
  • Firstpage
    592
  • Lastpage
    595
  • Abstract
    Self clearing in metallized film capacitors results in gradual failure from capacitance loss rather than sudden failure after the first breakdown. During clearing, the arc normally extinguishes with little change in the potential across the capacitor, i.e., the source potential (and impedance) for the clearing discharge is approximately constant. Usually an arc driven by constant source potential and impedance does not extinguish, and the reasons that this is not the case in self-clearing remain obscure. Applied voltage, interfacial pressure, and metallization resistance are generally considered the most important factors which influence the clearing process. We analyze the clearing process in the context of energy loss from the arc and physical processes related to gaseous products created by the arc. Increase of arc resistance and cooling of the arc as it lengthens contribute to clearing.
  • Keywords
    arcs (electric); metallisation; thin film capacitors; arc resistance; capacitance loss; clearing discharge; electric breakdown; energy loss; gradual failure; interfacial pressure; metalized film capacitors; metallization resistance; self clearing; source potential; Capacitors; Electric breakdown; Electrodes; Films; Metallization; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation (ISEI), Conference Record of the 2012 IEEE International Symposium on
  • Conference_Location
    San Juan, PR
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4673-0488-7
  • Electronic_ISBN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.2012.6251539
  • Filename
    6251539