• DocumentCode
    2759732
  • Title

    New technique for analysing coplanar lines on ceramic up to 110GHz

  • Author

    Min, Chunwei ; Free, Charles E.

  • Author_Institution
    Univ. of Surrey, Guildford
  • fYear
    2006
  • fDate
    12-15 Dec. 2006
  • Firstpage
    591
  • Lastpage
    594
  • Abstract
    A novel four-line, two-geometry (FLTG) measurement technique using coplanar waveguide structures is proposed for investigations on material characteristics from 1 GHz to 110 GHz. This measurement-based technique is simple and efficient when compared with other methods, and provides less uncertainty in the analysis, especially at mm-wave frequencies. The technique has been applied to the characterisation of coplanar lines on ceramic that were fabricated using photoimage able thick-film technology. The key outcome of the work is that it provides means of establishing surface loss at mm-wave frequencies.
  • Keywords
    ceramics; coplanar waveguides; microwave measurement; strip lines; ceramic; coplanar lines; coplanar waveguide structures; four-line two-geometry measurement technique; photoim thick-film technology; surface loss; Ceramics; Circuits; Conducting materials; Coplanar waveguides; Dielectric loss measurement; Dielectric losses; Frequency; Rough surfaces; Surface resistance; Surface roughness; LTCC; Microwave measurement; coplanar waveguide lines; multi-chip module; photoimageable thick-film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2006. APMC 2006. Asia-Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-4-902339-08-6
  • Electronic_ISBN
    978-4-902339-11-6
  • Type

    conf

  • DOI
    10.1109/APMC.2006.4429495
  • Filename
    4429495