DocumentCode
2761311
Title
Error Control to Increase the Yield of Semiconductor RAM´s
Author
Krishnamoorthy, Rajeev ; Heegard, Chris
Author_Institution
Cornell University
fYear
1989
fDate
1989
Keywords
Decoding; Error correction; Error correction codes; Random access memory; Read-write memory; Redundancy; Semiconductor device manufacture; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Workshop at Cornell, The 1989 IEEE/CAM
Type
conf
DOI
10.1109/ITW.1989.761432
Filename
761432
Link To Document