• DocumentCode
    2761456
  • Title

    Mass-frequency influence surface and frequency spectrum of an AT-cut quartz plate

  • Author

    Yong, Y.K. ; Stewart, J.T.

  • Author_Institution
    Rutgers Univ., Piscataway, NJ, USA
  • fYear
    1989
  • fDate
    3-6 Oct 1989
  • Firstpage
    429
  • Abstract
    The mass-frequency influence surface is defined as a surface yielding the frequency change due to a small localized mass applied on the plate surface. Finite-element solutions of R.D. Mindlin´s (1963) two-dimensional plate equations for thickness-shear, thickness-twist, and flexural vibrations are given. Spectrum splicing and an efficient eigenvalue solver using the Lanczos algorithm were incorporated into the finite-element program. A convergence study of the fundamental thickness-shear mode and its finite-element meshes of increasing fineness. As a general rule, more than two elements must span any half-wave in the plate or spurious mode shapes will be obtained. Two-dimensional mode shapes and the frequency spectrum of a rectangular AT-cut plate in the region of the fundamental thickness-shear frequency are presented. The mass-frequency influence surface for a 5-MHz-rectangular, AT-cut plate with patch electrodes is obtained by calculating the frequency change due to a small-mass layer moving over the plate surface. The frequency change is proportional to the ratio of mass loading to mass of plate per unit area, and is confined mostly within the electrode area, where the frequency change is on the order of 108 Hz/(g/mm2)/mm2
  • Keywords
    crystal resonators; finite element analysis; quartz; 5 MHz; AT-cut quartz plate; Lanczos algorithm; eigenvalue solver; fineness; finite-element meshes; finite-element program; flexural vibrations; frequency spectrum; half-wave; localized mass; mass-frequency influence surface; patch electrodes; spurious mode shapes; thickness-shear; thickness-twist; Capacitive sensors; Eigenvalues and eigenfunctions; Electrodes; Equations; Finite element methods; Frequency; Phase measurement; Shape; Splicing; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1989. Proceedings., IEEE 1989
  • Conference_Location
    Montreal, Que.
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1989.67022
  • Filename
    67022