DocumentCode
2761483
Title
Performance of semiconductor current filament lasers
Author
Vawter, G. Allen ; Baca, Albert G. ; Chow, Weng W. ; Hafich, Michael J. ; Hjalmarson, Harold P. ; Loubriel, Goillermo M. ; Mar, Alan ; O´Mlley, M.W. ; Zutavern, Fred J.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
874
Abstract
We present performance and modeling results for a new class of semiconductor laser that can potentially produce much more short pulse energy than conventional (injection-pumped) semiconductor lasers. High energy operation is possible because this new laser is not limited in volume or aspect ratio by the depth of a p-n junction. These lasers are created from current filaments in semi-insulating GaAs where low-field avalanche carrier generation produces a high-density, charge-neutral plasma channel having the required carrier density distribution for lasing. We have tested current filament semiconductor lasers (CFSL) that have produced 75 nJ of 890 nm light in 1.5 ns (50 W peak), approximately ten times more energy than conventional lasers. Current filaments as long as 3.4 cm and several hundred microns in diameter have been observed in our high-gain GaAs photoconductive switches. The smallest dimension of these filaments can be more than 100 times the carrier diffusion length in GaAs. It is this large active volume that enables the observed high laser output energy. This paper reports spectral narrowing, lasing thresholds, beam divergence, temporal narrowing, and energies for several configurations of CFSL. We also discuss results from models developed to simulate the unusual gain phenomena and mechanism for obtaining transparency within the electron-hole plasma of the current filament
Keywords
III-V semiconductors; avalanche breakdown; carrier density; gallium arsenide; optical pulse generation; semiconductor lasers; semiconductor plasma; spectral line narrowing; spontaneous emission; stimulated emission; surface emitting lasers; 1.5 ns; 75 nJ; 890 nm; GaAs; beam divergence; carrier density; electron-hole plasma; high energy operation; high-density charge-neutral plasma channel; high-gain photoconductive switches; laser performance; lasing thresholds; low-field avalanche carrier generation; models; semi-insulating GaAs; semiconductor current filament lasers; short pulse energy; spectral narrowing; spontaneous emission; stimulated emission; surface-emitting configuration; temporal narrowing; transparency; Charge carrier density; Gallium arsenide; Laser modes; Optical pulses; P-n junctions; Photoconductivity; Plasma density; Plasma simulation; Semiconductor device testing; Semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location
Rio Grande
ISSN
1092-8081
Print_ISBN
0-7803-5947-X
Type
conf
DOI
10.1109/LEOS.2000.894133
Filename
894133
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