• DocumentCode
    2761517
  • Title

    Optical Delay Tester

  • Author

    Ozaki, Kazuyuki ; Nagai, Toshiaki ; Wakana, Shin-ichi ; Sato, Yoko ; Goto, Yoshiro

  • fYear
    1993
  • fDate
    9-11 Jun 1993
  • Firstpage
    267
  • Lastpage
    270
  • Keywords
    Delay effects; High speed optical techniques; Integrated circuit testing; Lasers and electrooptics; Optical films; Optical pulses; Optical sensors; Photonic integrated circuits; Sampling methods; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1993., Proceedings of 1993 Japan International
  • Print_ISBN
    0-7803-1432-8
  • Type

    conf

  • DOI
    10.1109/IEMT.1993.639767
  • Filename
    639767
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2761517