• DocumentCode
    2762064
  • Title

    DECOUPLE: defect current detection in deep submicron IDDQ

  • Author

    Okuda, Yukio

  • Author_Institution
    Semicond. Co., Sony Corp., Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    199
  • Lastpage
    206
  • Abstract
    IDDQ test concept for deep submicron (DSM) devices named DECOUPLE (Defect Current Observation Under the Proportion of intrinsic Leakage currents) is proposed. A new clustering method obtained two defect free groups from a production data set by abstracting from a signature of intrinsic leakage current that is independent of process variations. Possible pass/fail tests, diagnosis, and detection of parametric defect currents are discussed on the data set. Another example of the pass/fail tests on a second product is presented
  • Keywords
    data analysis; electric current measurement; fault diagnosis; integrated circuit modelling; integrated circuit testing; leakage currents; production testing; DECOUPLE; clustering; deep submicron IDDQ; deep submicron devices; defect current detection; diagnosis; leakage currents; parametric defect currents; pass/fail tests; production data; signature; Circuit simulation; Circuit testing; Clustering methods; Costs; Current measurement; Leak detection; Leakage current; Production; Switches; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2000. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-6546-1
  • Type

    conf

  • DOI
    10.1109/TEST.2000.894207
  • Filename
    894207
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2762064