• DocumentCode
    2762146
  • Title

    Microstructure and surface chemistry of nanoporous “black silicon” for photovoltaics

  • Author

    Yan, Yanfa ; Yuan, Hao-Chih ; Yost, Vernon E. ; Jones, Kim ; Al-Jassim, Mowafak ; Branz, Howard M.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    We report our detailed investigation of the microstructure and surface chemistry of nanoporous black Si layers using transmission electron microscopy techniques. We find that the one-step nanoparticle-catalyzed liquid etch creates deep conical nanovoids. The cones provide the density-graded surface that suppresses reflection. The surface of the as-etched nanoporous black Si is an amorphous Si suboxide (SiOx) produced by the strongly oxidizing nanocatalyzed etch. The oxygen concentration decreases monotonically away from the nanovoid surface. This suboxide tends to be thinner near the cone tip than nearer to the wafer surface. The c-Si/suboxide interface is rough at the nanometer scale. Diffraction contrast reveals a high density of point defects in the c-Si near the c-Si/suboxide interface. These features account for the poor blue response of as-etched black Si solar cells. The passivation treatment is seen to convert the Si suboxide quite completely into SiO2 with a smooth c-Si/SiO2 interface. These changes are essential to achieve our 16.8%-efficient solar cells.
  • Keywords
    nanoporous materials; point defects; solar cells; surface chemistry; transmission electron microscopy; density-graded surface; diffraction contrast; microstructure; nanoporous black silicon; oxygen concentration; passivation treatment; photovoltaics; point defects; solar cells; suboxide interface; surface chemistry; transmission electron microscopy techniques;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5615853
  • Filename
    5615853