DocumentCode
2762339
Title
Measuring code edges of ADCs using interpolation and its application to offset and gain error testing
Author
Variyam, Pramodchandran N. ; Agrawal, Vinay
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
2000
fDate
2000
Firstpage
349
Lastpage
357
Abstract
Measuring analog threshold voltage between two different digital codes is a common test performed during production testing of ADCs. Due to the noisy nature of analog signals, this test can take considerable amount of costly test time. This paper presents a fast algorithm for measuring code edges of ADCs. In this method, a gaussian distribution is assumed for noise in ADCs and the code edges are determined by interpolating the inverse cumulative distribution of the gaussian function. A fast testing method for guaranteeing the specifications on offset and gain error is developed as a corollary to the code edge measuring technique. Practical issues in implementing this technique in production testing are discussed. Production test results show excellent repeatability and large saving in production test time
Keywords
Gaussian noise; analogue-digital conversion; circuit noise; circuit testing; interpolation; production testing; ADC; Gaussian noise; code edge measurement; gain error testing; interpolation; inverse cumulative distribution; offset testing; production testing; search algorithm; Gain measurement; Histograms; Instruments; Interpolation; Linearity; Performance gain; Production; Servomechanisms; Signal processing; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894224
Filename
894224
Link To Document