• DocumentCode
    2765827
  • Title

    Comparison of classification techniques-SVM and naives bayes to predict the Arboviral disease-Dengue

  • Author

    Fathima, Shameem ; Hundewale, Nisar

  • Author_Institution
    Coll. of Comput. & Inf. Technol., Taif Univ., Taif, Saudi Arabia
  • fYear
    2011
  • fDate
    12-15 Nov. 2011
  • Firstpage
    538
  • Lastpage
    539
  • Abstract
    In this paper we present the performance analysis of different data mining techniques to predict the Arboviral disease-Dengue. Data set used for the analysis is real time data taken from super specialty hospitals and diagnostic laboratories where the blood samples were collected for diagnostic investigations at study enrolment and again at hospital discharge. This data set consists of 5000 records with 29 parameters. In this paper we have investigated the data mining techniques: SVM and Naive Bayes Classifier. A proficient methodology - randomforest classifier with its associated Gini feature importance allows to identify small sets of parameters to be used for diagnostic purposes in clinical practice; this involves obtaining the smallest possible set of symptoms that can still achieve decent predictive performance for the dengue disease. We combine both the approaches, and evaluate the classifiers performance. The result of the comparison between the methods showed that SVM outperforms the Naïve Bayes in Dengue disease diagnosis.
  • Keywords
    Bayes methods; data mining; diseases; medical computing; pattern classification; support vector machines; Arboviral disease-dengue prediction; Gini feature importance; SVM; classification technique; clinical practice; data mining; dengue disease diagnosis; diagnostic purpose; naive Bayes classifier; random forest classifier; Accuracy; Data mining; Diseases; Educational institutions; Learning systems; Medical diagnostic imaging; Support vector machines; Naïve Bayes; SVM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedicine Workshops (BIBMW), 2011 IEEE International Conference on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4577-1612-6
  • Type

    conf

  • DOI
    10.1109/BIBMW.2011.6112426
  • Filename
    6112426