• DocumentCode
    2766613
  • Title

    Simple removal technology using ozone solution for chemically-stable polymer used for MEMS

  • Author

    Yanagida, H. ; Yoshida, S. ; Esashi, M. ; Tanaka, S.

  • Author_Institution
    Tohoku Univ., Sendai, Japan
  • fYear
    2011
  • fDate
    23-27 Jan. 2011
  • Firstpage
    324
  • Lastpage
    327
  • Abstract
    This paper reports simple removal technology using ozone solution for chemically-stable polymers such as SU-8, BCB, polyimide and carbonized resist. Conventionally, these polymers are difficult to remove completely by O2 plasma and organic solutions because of their chemical stability and inorganic additives. In this study, these polymers were etched using acetic acid and water solution of ozone. Residue analysis after polymer etching was performed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The analysis demonstrated that the ozone solution could etch and remove these polymers without residue. This strong etching effect might be attributed to strong organic decomposition ability of ozone and rinse effect of inorganic materials in wet process.
  • Keywords
    X-ray photoelectron spectra; etching; micromechanical devices; ozone; polymers; scanning electron microscopy; water; MEMS; O2; Residue analysis; X-ray photoelectron spectroscopy; acetic acid; chemically-stable polymer; inorganic additives; inorganic materials; organic decomposition; organic solutions; ozone. water solution; polymer etching; scanning electron microscopy; simple removal technology; Etching; Plasmas; Polyimides; Resists; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
  • Conference_Location
    Cancun
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-9632-7
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2011.5734427
  • Filename
    5734427