DocumentCode
2766613
Title
Simple removal technology using ozone solution for chemically-stable polymer used for MEMS
Author
Yanagida, H. ; Yoshida, S. ; Esashi, M. ; Tanaka, S.
Author_Institution
Tohoku Univ., Sendai, Japan
fYear
2011
fDate
23-27 Jan. 2011
Firstpage
324
Lastpage
327
Abstract
This paper reports simple removal technology using ozone solution for chemically-stable polymers such as SU-8, BCB, polyimide and carbonized resist. Conventionally, these polymers are difficult to remove completely by O2 plasma and organic solutions because of their chemical stability and inorganic additives. In this study, these polymers were etched using acetic acid and water solution of ozone. Residue analysis after polymer etching was performed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The analysis demonstrated that the ozone solution could etch and remove these polymers without residue. This strong etching effect might be attributed to strong organic decomposition ability of ozone and rinse effect of inorganic materials in wet process.
Keywords
X-ray photoelectron spectra; etching; micromechanical devices; ozone; polymers; scanning electron microscopy; water; MEMS; O2; Residue analysis; X-ray photoelectron spectroscopy; acetic acid; chemically-stable polymer; inorganic additives; inorganic materials; organic decomposition; organic solutions; ozone. water solution; polymer etching; scanning electron microscopy; simple removal technology; Etching; Plasmas; Polyimides; Resists; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2011 IEEE 24th International Conference on
Conference_Location
Cancun
ISSN
1084-6999
Print_ISBN
978-1-4244-9632-7
Type
conf
DOI
10.1109/MEMSYS.2011.5734427
Filename
5734427
Link To Document