• DocumentCode
    2768454
  • Title

    Obtaining accurate confidence regions for the estimated zeros and poles in system identification problems

  • Author

    Vuerinckx, R. ; Pintelon, R. ; Schoukens, J. ; Rolain, Y.

  • Author_Institution
    Vrije Univ., Brussels, Belgium
  • Volume
    4
  • fYear
    1998
  • fDate
    16-18 Dec 1998
  • Firstpage
    4464
  • Abstract
    System identification techniques allow to obtain actual numbers for the parameters of a device under test (DUT). However, of almost equal importance is to know how accurate these calculated values are. When modelling the DUT by a rotational function in the frequency domain, the covariance matrix of the coefficients can be approximated pretty well, and this matrix defines a confidence ellipsoid in the coefficient space in which the true coefficients must lie with a given probability. When calculating the zeros and the poles of this model, one would also like to know how precise these zeros and poles are; with possibly a graphical representation of their confidence region. However, until now the uncertainty of the zeros and poles was calculated by a linearization of the nonlinear transformation between the coefficients and the roots. It will be shown that this approach may significantly underestimate the uncertainty of the zero/pole estimates. An algorithm will be presented that calculates confidence regions which match very well the true uncertainty regions of the zero/pole estimates. Simulations are included to show its effectiveness
  • Keywords
    covariance matrices; frequency-domain analysis; identification; poles and zeros; probability; rational functions; testing; coefficient space; confidence ellipsoid; confidence regions; covariance matrix; device testing; estimated poles; estimated zeros; frequency domain; graphical representation; linearization; nonlinear transformation; probability; roots; rotational function; system identification problems; Covariance matrix; Ellipsoids; Frequency domain analysis; Frequency estimation; Noise measurement; Poles and zeros; Signal processing; System identification; System testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1998. Proceedings of the 37th IEEE Conference on
  • Conference_Location
    Tampa, FL
  • ISSN
    0191-2216
  • Print_ISBN
    0-7803-4394-8
  • Type

    conf

  • DOI
    10.1109/CDC.1998.762018
  • Filename
    762018