DocumentCode
2769556
Title
Aemulus
fYear
2008
fDate
1-3 Dec. 2008
Firstpage
1
Lastpage
1
Keywords
Algorithm design and analysis; Consumer electronics; Costs; Electronic equipment testing; Integrated circuit testing; Navigation; Radio frequency; Semiconductor device testing; System testing; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, 2008. ICED 2008. International Conference on
Conference_Location
Penang, Malaysia
Print_ISBN
978-1-4244-2315-6
Electronic_ISBN
978-1-4244-2315-6
Type
conf
DOI
10.1109/ICED.2008.4786617
Filename
4786617
Link To Document