• DocumentCode
    2771656
  • Title

    Millimeter-wave amplifiers in 65-nm CMOS

  • Author

    Varonen, Mikko ; Kärkkäinen, Mikko ; Halonen, Kari A I

  • Author_Institution
    Helsinki Univ. of Technol., Espoo
  • fYear
    2007
  • fDate
    11-13 Sept. 2007
  • Firstpage
    280
  • Lastpage
    283
  • Abstract
    We report 40 GHz and 60 GHz amplifiers in 65-nm CMOS achieving state-of-the-art performance. Simulations are verified with on-wafer measurement results. The 40-GHz amplifier exhibits 14.3 dB of gain at 42 GHz and better than 10 dB between 38 to 54 GHz with a compact chip area of 0.286 mm2. The measured noise figure is 6 dB at 50 GHz. The 1-dB output compression point is at +6-dBm power level using a 1.2 V supply. The 60-GHz amplifier achieves better than 11 dB of small-signal gain from 45 to 65 GHz. The measured noise figure is 5.6 dB at 60 GHz and below 6 dB from 55 to 65 GHz. The AM/AM and AM/PM characteristics of the 60-GHz amplifier chip were extracted from the large-signal S-parameter measurement results. The saturated output power is +7 dBm at 60 GHz using a 1.2 V supply. The size of the 60-GHz amplifier is 0.87 mm times 0.70 mm.
  • Keywords
    CMOS analogue integrated circuits; S-parameters; millimetre wave amplifiers; millimetre wave integrated circuits; 65-nm CMOS; AM/AM characteristics; AM/PM characteristics; frequency 40 GHz; frequency 42 GHz; frequency 60 GHz; gain 14.3 dB; large-signal S-parameter measurement; millimeter-wave amplifiers; noise figure; noise figure 6 dB; on-wafer measurement; output compression point; size 0.70 mm; size 0.87 mm; size 65 nm; voltage 1.2 V; CMOS technology; Capacitors; Circuit simulation; Coplanar waveguides; Frequency; Millimeter wave communication; Millimeter wave technology; Millimeter wave transistors; Noise figure; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference, 2007. ESSCIRC 2007. 33rd European
  • Conference_Location
    Munich
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-1125-2
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2007.4430298
  • Filename
    4430298