• DocumentCode
    2773906
  • Title

    Swept frequency measurement of dielectric constant over 100 MHz to 18 GHz

  • Author

    McCutchan, Duane

  • Author_Institution
    Northorp Corp., Hawthorne, CA, USA
  • Volume
    21
  • fYear
    1983
  • fDate
    30437
  • Firstpage
    369
  • Lastpage
    371
  • Abstract
    A measurement technique is in use which permits the rapid measurement of dielectric properties of material over the frequency range of 100 MHz to 18 GHz. This non-destructive measurement is readily adaptable to continuous on-line process control, dielectric thickness measurement, and low and high temperature measurements.
  • Keywords
    Admittance measurement; Antenna measurements; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Magnetic materials; Measurement techniques; Position measurement; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1983
  • Type

    conf

  • DOI
    10.1109/APS.1983.1149046
  • Filename
    1149046