DocumentCode
2774429
Title
Thermal modeling of diamond-based power electronics packaging
Author
Fabis, P.M. ; Shum, D. ; Windischmann, H.
Author_Institution
North Diamond Film, Northboro, MA, USA
fYear
1999
fDate
9-11 March 1999
Firstpage
98
Lastpage
104
Abstract
Finite element modeling suggests that the thermal performance of plastic and ceramic packages could be significantly improved through the insertion of CVD diamond substrates. The model was formulated by considering the thermal properties, dimensions, and spatial locations of the materials comprising the dominant conductive thermal path. Optimized designs were selected, targeting the minimization of die junction temperature, package maximum temperature, and package temperature gradients through the reduction of the heat source to heat sink thermal resistance. Selected designs were fabricated and thermally evaluated using infrared thermometry. Diamond-enhanced package designs using leadframe-substrate "overlaps" for plastic SOIC packages and through-flange "inserts" for ceramic power packages realized junction temperature decreases of greater than 50%.
Keywords
ceramic packaging; chemical vapour deposition; diamond; finite element analysis; integrated circuit design; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; minimisation; plastic packaging; power integrated circuits; temperature distribution; thermal analysis; thermal management (packaging); thermal resistance; C; CVD diamond substrate insertion; CVD diamond substrates; ceramic packages; ceramic power packages; diamond-based power electronics packaging; diamond-enhanced package designs; die junction temperature; dominant conductive thermal path; finite element modeling; heat source to heat sink thermal resistance; infrared thermometry; junction temperature; leadframe-substrate overlaps; material dimensions; material spatial locations; optimized designs; package maximum temperature; package temperature gradients; plastic SOIC packages; plastic packages; temperature minimization; thermal evaluation; thermal modeling; thermal performance; thermal properties; through-flange inserts; Ceramics; Electronic packaging thermal management; Finite element methods; Heat sinks; Plastic packaging; Power electronics; Resistance heating; Temperature; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1999. Fifteenth Annual IEEE
Conference_Location
San Diego, CA, USA
ISSN
1065-2221
Print_ISBN
0-7803-5264-5
Type
conf
DOI
10.1109/STHERM.1999.762434
Filename
762434
Link To Document