• DocumentCode
    2779147
  • Title

    Non-destructive testing of microstrip antenna substrate material

  • Author

    Miller, G.E.

  • Author_Institution
    Boeing Aerospace Company, Seattle, WA, USA
  • Volume
    22
  • fYear
    1984
  • fDate
    25-29 June 1984
  • Firstpage
    275
  • Lastpage
    278
  • Keywords
    Dielectric constant; Dielectric measurements; Dielectric substrates; Fabrication; Image reconstruction; Materials testing; Microstrip antenna arrays; Microstrip antennas; Nondestructive testing; Reconstruction algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1984
  • Conference_Location
    Boston, MA, USA
  • Type

    conf

  • DOI
    10.1109/APS.1984.1149315
  • Filename
    1149315
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2779147