• DocumentCode
    2779364
  • Title

    Multi receiver concentrator photovoltaic testing at extreme concentrations

  • Author

    Van Kessel, Theodore ; Abduljabar, Ayman ; Alyahya, Abdulaziz ; Alyousef, Badr ; Badahdah, Alhassan ; Khonkar, Hussam ; Kirchner, Peter ; Martin, Yves ; Manzer, Dennis ; Moumen, Naim ; Prabhakar, Aparna ; Picunko, Thomas ; Sandstrom, Robert ; Al-Saaedi, Y

  • Author_Institution
    IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Practical multi receiver concentrator photovoltaic systems operating at high solar concentration levels up to 2000 suns experience large radiation, thermal and electrical loads in addition to large power density transients under routine operation. These systems require efficient cooling to manage the associated incident power densities between 100 to 200 W/cm2. Photovoltaic cells and thermal interface materials experience considerable stress under these load conditions. Their assembly is sensitive to contamination and process optimization. Efficient optical coupling of light at high concentration requires precise component alignment and tracking. We will discuss high power testing of single and multi receiver, high concentration systems comprising commercial triple junction cells, Fresnel optics, electric actuators, and cooled through a metal thermal interface using active and passive cooling methods.
  • Keywords
    cooling; photovoltaic cells; solar cells; solar energy concentrators; thermal analysis; transient analysis; Fresnel optics; active cooling methods; associated incident power density; commercial triple junction cells; contamination; efficient optical coupling; electric actuators; high solar concentration levels; metal thermal interface materials; multireceiver concentrator photovoltaic system testing; passive cooling methods; photovoltaic cells; power density transients; process optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5616784
  • Filename
    5616784