• DocumentCode
    2779393
  • Title

    Tripping Characteristics of Residual Current Devices under Non-Sinusoidal Currents

  • Author

    Luo, Xiang ; Du, Y. ; Wong, X.H. ; Chen, M.L.

  • Author_Institution
    Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2010
  • fDate
    3-7 Oct. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presented an experimental investigation into operating characteristics of RCDs under an unbalanced current. The unbalanced current included the harmonic current, ground fault current, and surge current. A testing system was first set up in the laboratory, and the minimum value of the current causing RCD samples to trip were recorded. To obtain consistent testing results, RCD samples under test were demagnetized prior to each test. It is found that RCD tripping is primarily determined by the peak value of the unbalanced current. Under a ground fault RCDs installed in healthy circuits may trip. It would be necessary to limit the maximum leakage current in the circuits to avoid such nuisance tripping. Under surge conditions RCDs could withstand a large short-duration current. However, a long-duration surge current can easily cause RCDs to trip.
  • Keywords
    earthing; fault currents; residual current devices; RCD; ground fault current; harmonic current; maximum leakage current; nonsinusoidal currents; nuisance tripping; residual current devices; surge current; tripping characteristics; unbalanced current; Circuit faults; Current transformers; Fault currents; Harmonic analysis; Leakage current; Magnetic cores; Surges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting (IAS), 2010 IEEE
  • Conference_Location
    Houston, TX
  • ISSN
    0197-2618
  • Print_ISBN
    978-1-4244-6393-0
  • Type

    conf

  • DOI
    10.1109/IAS.2010.5616786
  • Filename
    5616786