DocumentCode
2782870
Title
Exciton binding energy in semiconductor nanowires in the presence of dielectric de-confinement
Author
Ramanthan, S. ; Bandyopadhyay, S. ; Edwards, J.D. ; Nelson, J. ; Anderson, J.
Author_Institution
Department of Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, VA 23284, USA
Volume
1
fYear
2006
fDate
17-20 June 2006
Firstpage
110
Lastpage
112
Abstract
Fluorescence spectra of 10-, 25- and 50-nm diameter CdS nanowires (relative dielectric constant = 5.4) self assembled in a porous alumina matrix (relative dielectric constant = 8-10) reveal peaks associated with free electron-hole recombination. The 10-nm wires also show an additional lower energy peak due to exciton recombination. In spite of dielectric de-confinement caused by the insulator having a higher dielectric constant than the semiconductor, the exciton binding energy increases almost 8-fold from its bulk value. This increase is most likely due to quantum confinement accruing from the fact that the exciton Bohr radius (~5 nm) is comparable to or larger than the wire radius, especially if side depletion is taken into account. Such an increase in the binding energy could be exploited to make efficient room temperature luminescent devices in the visible range.
Keywords
Excitons; binding energy; dielectric de-confinement; Dielectric constant; Dielectrics and electrical insulation; Excitons; Fluorescence; High-K gate dielectrics; Nanowires; Radiative recombination; Self-assembly; Spontaneous emission; Wires; Excitons; binding energy; dielectric de-confinement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN
1-4244-0077-5
Type
conf
DOI
10.1109/NANO.2006.247580
Filename
1717030
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