DocumentCode
2783087
Title
OLED Device Operational Lifetime: Insights and Challenges
Author
Xia, Sean C. ; Kwong, Raymond C. ; Adamovich, Vadim I. ; Weaver, Michael S. ; Brown, Julie J.
Author_Institution
Universal Display Corp., Ewing, NJ
fYear
2007
fDate
15-19 April 2007
Firstpage
253
Lastpage
257
Abstract
This paper discusses some of the most important intrinsic and extrinsic factors that affect the organic light-emitting devices (OLEDs) stability. OLEDs lifetime can be greatly improved through materials design by improving the redox properties, thermal properties, and charge transporting properties. Extrinsic factors, such as materials purity, are also discussed.
Keywords
life testing; organic light emitting diodes; semiconductor device reliability; semiconductor device testing; OLED device operational lifetime; OLED stability; charge transporting properties; materials purity; organic light-emitting devices; phosphorescence; redox properties; thermal properties; Active matrix technology; Excitons; Flat panel displays; Fluorescence; Optical devices; Organic light emitting diodes; Phosphorescence; Stability; Stimulated emission; Transistors; OLED; PHOLED; lifetime; phosphorescence; stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
Conference_Location
Phoenix, AZ
Print_ISBN
1-4244-0919-5
Electronic_ISBN
1-4244-0919-5
Type
conf
DOI
10.1109/RELPHY.2007.369901
Filename
4227642
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