• DocumentCode
    2783876
  • Title

    Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation

  • Author

    Douin, A. ; Pouget, V. ; Lewis, D. ; Fouillat, P. ; Perdu, P.

  • Author_Institution
    IMS, Talence
  • fYear
    2007
  • fDate
    15-19 April 2007
  • Firstpage
    520
  • Lastpage
    525
  • Abstract
    This paper presents new approaches for timing analysis in fast integrated circuits using picosecond pulsed laser stimulation. The proposed techniques provide very good temporal resolution as illustrated by several case studies on digital test structures. They can be used for localizing defects inducing timing faults.
  • Keywords
    VLSI; failure analysis; timing; digital test structures; integrated circuits; picosecond timing analysis; pulsed laser stimulation; temporal resolution; Circuit analysis; High speed optical techniques; Laser mode locking; Laser modes; Optical beams; Optical pulses; Pulse circuits; Stimulated emission; Timing; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability physics symposium, 2007. proceedings. 45th annual. ieee international
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    1-4244-0919-5
  • Electronic_ISBN
    1-4244-0919-5
  • Type

    conf

  • DOI
    10.1109/RELPHY.2007.369945
  • Filename
    4227686
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2783876