• DocumentCode
    2784033
  • Title

    Optical modeling of light trapping in thin film silicon solar cells using the FDTD method

  • Author

    Lacombe, J. ; Chakanga, K. ; Geissendörfer, S. ; von Maydell, K. ; Agert, C.

  • Author_Institution
    NEXT ENERGY, EWE-Forschungszentrum fur Energietechnologie e.V., Oldenburg, Germany
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    In this paper we present our recent work on modeling the light propagation in silicon thin film solar cells. The aim is to create a realistic view of the light trapping effects and of the resulting optical generation rate. The focus is on real three dimensional systems. Our software Sentaurus TCAD, developed by Synopsys, has the ability to import real topography measurements and to model the light propagation with the Finite-Difference Time-Domain method (FDTD). The first simulation deals with the glass/TCO system. The electric field and intensity distribution (PowerFluxDensity) are shown as simulation output. The transmission and reflection is compared to real measurements. The second simulation focuses on the optical generation rate in the TCO/a-Si:H system. The distribution of the optical generation is correlated to the interface roughness and furthermore the optical generation is shown for different angles of incidence.
  • Keywords
    elemental semiconductors; finite difference time-domain analysis; light propagation; power engineering computing; semiconductor thin films; silicon; solar cells; FDTD method; Sentaurus TCAD; Si; finite difference time-domain method; intensity distribution; light propagation; light trapping effects; optical generation rate; thin film silicon solar cells; Absorption; Glass; Optical films; Optical polarization; Optical reflection; Optical scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5617030
  • Filename
    5617030