• DocumentCode
    2784512
  • Title

    Carbon nanotube-composite wafer bonding for ultra-high efficiency III–V multijunction solar cells

  • Author

    Boca, Andreea ; Boisvert, Joseph C. ; Law, Daniel C. ; Mesropian, Shoghig ; Karam, Nasser H. ; Hong, William D. ; Woo, Robyn L. ; Bhusari, Dhananjay M. ; Turevskaya, Evgeniya ; Mack, Patrick ; Glatkowski, Paul

  • Author_Institution
    Boeing-Spectrolab, Inc., Sylmar, CA, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Device-wafer bonding provides a platform for the implementation of ultra-high-efficiency multijunction solar cell designs, by allowing optimal subcell bandgap combinations to be attained while using only high-quality materials lattice-matched to their growth substrates. One promising new method for achieving wafer bonding is to use carbon nanotube composite thin films as the bonding agent between subcells grown on dissimilar substrates. In this paper we present the first demonstration of CNT-composite bonding of III-V materials, and evaluate its suitability for solar-cell integration in terms of optical transparency, electrical conductivity, bond uniformity and robustness, and bonded-device electrical performance. Another, relatively more mature method for device-wafer integration is that of direct semiconductor bonding technology. In order to provide a basis for comparison with CNT-bonding, we also summarize the latest achievements of the SBT solar cell development effort at Spectrolab.
  • Keywords
    III-V semiconductors; carbon nanotubes; electrical conductivity; solar cells; wafer bonding; carbon nanotube composite wafer bonding; device wafer bonding; electrical conductivity; lll-V solar cells; multijunction solar cell; optical transparency; optimal subcell bandgap combination; ultra-high efficiency solar cells; Bonding; Films; Photovoltaic cells; Resistance; Semiconductor device measurement; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5617076
  • Filename
    5617076