DocumentCode
2785000
Title
Photonic force microscopy with back-scattered light
Author
Volpe, Giovanni ; Kozyreff, Gregory ; Petrov, Dmitri
Author_Institution
ICFO-Institut de Ciencies Fotoniques, Mediterranean Technology Park, 08860 Castelldefels (Barcelona), Spain
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
We compare the sensitivity of the Photonic Force Microscope for the forward-scattering and backward-scattering geometries, calculating the total-scattered electromagnetic field from a dielectric bead in an optical trap using a Mie-Debye approach.
Keywords
Biomedical optical imaging; Charge carrier processes; Electromagnetic scattering; Light scattering; Mie scattering; Optical microscopy; Optical scattering; Optical sensors; Particle scattering; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location
Baltimore, MD, USA
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/QELS.2007.4431176
Filename
4431176
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