• DocumentCode
    2788610
  • Title

    Continuing radiation evaluation of commercial-off-the-shelf devices for space applications

  • Author

    Gorelick, J.L. ; McClure, S.S.

  • Author_Institution
    Hughes Space & Commun. Co., Los Angeles, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    6
  • Lastpage
    10
  • Abstract
    Radiation test results are presented for a number of commercial transistors and integrated circuits procured in both ceramic and plastic packages. This is part of an ongoing evaluation of the suitability of commercial-off-the-shelf devices for space applications
  • Keywords
    ceramic packaging; integrated circuit packaging; integrated circuit testing; plastic packaging; radiation effects; space vehicle electronics; ceramic packages; commercial transistors; commercial-off-the-shelf devices; continuing radiation evaluation; integrated circuits; plastic package; radiation test results; space applications; Analog integrated circuits; Circuit testing; Degradation; EPROM; Integrated circuit testing; MOSFETs; Manufacturing; Plastic integrated circuit packaging; Plastic packaging; Propulsion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2000
  • Conference_Location
    Reno, NV
  • Print_ISBN
    0-7803-6474-0
  • Type

    conf

  • DOI
    10.1109/REDW.2000.896261
  • Filename
    896261