• DocumentCode
    2788665
  • Title

    Processor array self-reconfiguration by neural networks

  • Author

    Yih, J.S. ; Mazumder, P.

  • Author_Institution
    Michigan Univ., Ann Arbor, MI, USA
  • fYear
    1992
  • fDate
    22-24 Jan 1992
  • Firstpage
    55
  • Lastpage
    64
  • Abstract
    The authors introduce a novel type of neural network which can be intelligently employed for controlling the reconfiguration circuits within a VLSI/WSI chip. In this implementation, the neural network is interconnected and programmed such that it can readily execute a maximum matching algorithm in order to assign fault-free spare elements to faulty components. This approach has been compared with the traditional reconfiguration algorithms, and by intensive simulation it is shown that the proposed neural net approach provides superior quality performance (i.e., higher survivability rates). It is also shown that the intrinsic fault-tolerant nature of neural networks maintains a degradable reconfiguration control even in the presence of faulty neural network components. The speed of neural networks provides an added advantage for online reconfiguration, where the chip can be quickly repaired by itself, thus reducing the system down-time
  • Keywords
    VLSI; fault tolerant computing; microprocessor chips; neural nets; parallel architectures; redundancy; WSI chips; automatic self-repair; degradable reconfiguration control; intrinsic fault-tolerant nature; maximum matching algorithm; neural networks; online reconfiguration; processor array self reconfiguration; reconfiguration algorithms; survivability rates; wafer scale integration; Algorithm design and analysis; Automatic control; Circuit faults; Degradation; Integrated circuit interconnections; Intelligent networks; Logic arrays; Multiprocessor interconnection networks; Neural networks; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-2482-5
  • Type

    conf

  • DOI
    10.1109/ICWSI.1992.171796
  • Filename
    171796