• DocumentCode
    2789761
  • Title

    Eddy current testing in thickness measurement of material with multi-layer structure

  • Author

    Chen, Peihua ; Huang, Pingjie ; Li, Guohou ; Cai, Wen ; Zhou, Zekui

  • Author_Institution
    Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou, China
  • fYear
    2009
  • fDate
    17-19 June 2009
  • Firstpage
    2065
  • Lastpage
    2068
  • Abstract
    The fundamental law of the variation of the probe´s impedance in thickness measurement of layer structure material using eddy current sensors including the liftoff phenomena has been found that is the variation of the conductivity of the material which is nearest to the probe of the sample with certain thickness has the critical effect in the induced variation of the probe´s impedance in eddy current testing at multilayer material. Therewith the paper prove it by the operation results of the analytical model of multilayer structure in eddy current testing. And accordingly it explains different appearances of experiments well in multilayer material eddy current testing.
  • Keywords
    eddy current testing; materials handling; thickness control; thickness measurement; eddy current testing; liftoff phenomena; material conductivity variation; material thickness measurement; multilayer structure material; Analytical models; Conducting materials; Conductivity; Eddy current testing; Eddy currents; Impedance; Nonhomogeneous media; Probes; Sensor phenomena and characterization; Thickness measurement; eddy current; multi-layer structure; thickness measuring; variation in conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference, 2009. CCDC '09. Chinese
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-2722-2
  • Electronic_ISBN
    978-1-4244-2723-9
  • Type

    conf

  • DOI
    10.1109/CCDC.2009.5192278
  • Filename
    5192278