• DocumentCode
    2790837
  • Title

    Effects of global interconnect optimizations on performance estimation of deep submicron design

  • Author

    Yu Cao ; Chenming Hu ; Xuejue Huang ; Kahng, A.B. ; Muddu, S. ; Stroobandt, D. ; Sylvester, D.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    2000
  • fDate
    5-9 Nov. 2000
  • Firstpage
    56
  • Lastpage
    61
  • Abstract
    In this paper, we quantify the impact of global interconnect optimization techniques that address such design objectives as delay, peak noise, delay uncertainty due to noise, power, and cost. In doing so, we develop a new system-performance simulation model as a set of studies within the MARCO GSRC Technology Extrapolation (GTX) system. We model a typical point-to-point global interconnect and focus on accurate assessment of both circuit and design technology with respect to such issues as inductance, signal line shielding, dynamic delay, buffer placement uncertainty and repeater staggering. We demonstrate, for example, that optimal wire sizing models need to consider inductive effects-and that use of more accurate (-1,3) worst-case capacitive coupling noise switch factors substantially increases peak noise estimates compared to traditional (0,2) bounds. We also find that optimal repeater sizes are significantly smaller than conventional models would suggest, especially when considering energy-delay issues.
  • Keywords
    VLSI; circuit CAD; digital simulation; extrapolation; optimisation; MARCO GSRC technology extrapolation system; buffer placement uncertainty; deep submicron design; delay; delay uncertainty; dynamic delay; global interconnect optimizations; optimal repeater sizes; peak noise; performance estimation; point-to-point global interconnect; signal line shielding; system-performance simulation model; Circuit noise; Cost function; Delay; Design optimization; Integrated circuit interconnections; Power system interconnection; Power system modeling; Repeaters; Switches; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-6445-7
  • Type

    conf

  • DOI
    10.1109/ICCAD.2000.896451
  • Filename
    896451