DocumentCode
2791058
Title
Equalizer design and performance trade-offs in ADC-based serial links
Author
Kim, Jaeha ; Ren, Jihong ; Leibowitz, Brian S. ; Satarzadeh, Patrick ; Abbasfar, Ali-Azam ; Zerbe, Jared
Author_Institution
Rambus, Inc., Los Altos, CA, USA
fYear
2010
fDate
19-22 Sept. 2010
Firstpage
1
Lastpage
8
Abstract
To address the increasing demand but potential power/area penalties of implementing ADC-based high-speed serial receivers, this paper analyzes the performance benefit of using non-uniform quantization and describes a way of determining the optimal set of ADC quantization thresholds. In contrast to common wisdom, the ADC thresholds for the minimum bit-error rate (BER) can be very different from those for the minimum quantization errors, especially with limited ADC resolution. It is recognized that the loop-unrolling DFE receiver and ADC-based DFE receiver are functionally equivalent and thus can share some design principles. The proposed reduced-slicer partial-response DFE (RS-PRDFE) receiver leverages this fact and achieves the BER of a 3~4-bit uniform ADC only with 4 data slicers. However, performing linear equalization (LE) in digital domain in addition to the DFE may incur severe performance penalty if the ADC resolution is kept coarse. Therefore, for practical implementations, it is more reasonable to realize the LE in analog domain. Analyses based on the measured results with 3" and 10.6" backplane channels support this claim.
Keywords
decision feedback equalisers; error statistics; quantisation (signal); receivers; ADC quantization thresholds; ADC-based serial links; bit error rate; data slicers; decision feedback equalisers; high-speed serial receivers; linear equalization; minimum quantization errors; non-uniform quantization; performance penalty; reduced-slicer partial-response DFE receiver; Backplanes; Bit error rate; Decision feedback equalizers; Quantization; Receivers; Transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2010 IEEE
Conference_Location
San Jose, CA
ISSN
0886-5930
Print_ISBN
978-1-4244-5758-8
Type
conf
DOI
10.1109/CICC.2010.5617601
Filename
5617601
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