• DocumentCode
    2791350
  • Title

    Statistical design techniques for high-speed circuit boards with correlated structure distributions

  • Author

    Mikazuki, Tetsuo ; Matsui, Norio

  • Author_Institution
    NTT Commun. Switching Lab., Tokyo, Japan
  • fYear
    1990
  • fDate
    1-3 Oct 1990
  • Firstpage
    185
  • Lastpage
    191
  • Abstract
    New statistical design techniques have been developed for the line structures of high-speed circuit boards. These techniques account for dimensional distribution correlations caused by the fabrication process. Monte Carlo simulation is introduced into the finite-element method for calculating line parameters. The eye-pattern at the receiving end of transmission lines with parallel and stub parts is simulated, using distributed circuit models, for the calculated line parameter distributions. The simulator has an algorithm to save computer time. The calculated and experimental results are compared, and the accuracy of the simulation is discussed. Calculation results imply that the evaluation for the dimensional distribution of fabrication processes is very important. The timing and amplitude margins are found to depend strongly on fabrication deviations
  • Keywords
    Monte Carlo methods; finite element analysis; printed circuit design; transmission lines; Monte Carlo simulation; amplitude margins; correlated structure distributions; dimensional distribution correlations; distributed circuit models; eye-pattern; fabrication deviations; fabrication process; finite-element method; high-speed circuit boards; line structures; statistical design techniques; timing margins; Circuit noise; Circuit simulation; Communication switching; Computational modeling; Crosstalk; Degradation; Fabrication; Finite element methods; Manufacturing; Printed circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1990 Proceedings, Competitive Manufacturing for the Next Decade. IEMT Symposium, Ninth IEEE/CHMT International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/IEMT9.1990.115004
  • Filename
    115004