DocumentCode
2793678
Title
Integrated model-based and data-driven diagnostic strategies applied to an anti-lock brake system
Author
Luo, Jianhui ; Namburu, Madhavi ; Pattipati, Krishna R. ; Qiao, Liu ; Chigusa, Shunsuke
Author_Institution
Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT
fYear
2005
fDate
5-12 March 2005
Firstpage
3702
Lastpage
3708
Abstract
Model-based fault diagnosis, using statistical techniques, residual generation (by analytical redundancy), and parameter estimation, has been an active area of research for the past four decades. However, these techniques are developed in isolation and generally a single technique can not address the diagnostic problems in complex systems. In this paper, we investigate a hybrid approach, which combines different techniques to obtain better diagnostic performance than the use of a single technique alone, and demonstrate it on an anti-lock brake system. In this approach, we first combine the parity equations and nonlinear observer to generate the residuals. Statistical tests, in particular generalized likelihood ratio tests (GLRT), are used to detect a subset of faults that are easier to detect. Support vector machines (SVM) is used for fault isolation of less-sensitive parametric faults. Finally, subset selection for improved parameter estimation is used to estimate fault severity
Keywords
braking; fault diagnosis; observers; parameter estimation; road vehicles; statistical testing; support vector machines; anti-lock brake system; complex systems; data-driven diagnostic strategy; fault isolation; fault severity estimation; generalized likelihood ratio tests; integrated model; model-based fault diagnosis; nonlinear observer; parameter estimation; parametric faults; parity equations; residual generation; subset selection; support vector machines; Fault detection; Fault diagnosis; Nonlinear equations; Parameter estimation; Pulse width modulation; Sliding mode control; Support vector machines; Testing; USA Councils; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2005 IEEE
Conference_Location
Big Sky, MT
Print_ISBN
0-7803-8870-4
Type
conf
DOI
10.1109/AERO.2005.1559675
Filename
1559675
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