DocumentCode
2794307
Title
A design of mixed-signal test controller based on boundary scan
Author
Chen, Shengjian ; Wang, Mengmeng ; Xu, Lei ; Zhou, Yin
Author_Institution
Dept. of Control Eng., Acad. of Armored Force Eng., Beijing, China
fYear
2011
fDate
15-17 July 2011
Firstpage
940
Lastpage
943
Abstract
With the rapid development of microelectronics, it is difficult to test complicated integrated circuit for the traditional test methods. For this circs, JTAG puts forward a new kind of circuit test method - boundary scan technology. According to the IEEE1149.4, a boundary scan controller is designed by ATmega128 MCU and SN74ACT8990. Experiments show that the test controller can locate faults rapidly. The design of the boundary scan controller provides a basis for the further research of mixed electronic system BIT.
Keywords
boundary scan testing; integrated circuit testing; microcontrollers; ATmega128 MCU; IEEE1149.4; JTAG; SN74ACT8990; boundary scan controller; boundary scan technology; integrated circuit testing; microelectronics; mixed-signal test controller; Circuit faults; Integrated circuit interconnections; Microcontrollers; Process control; Registers; Software; Testing; IEEE1149.4; boundary scan; test controller;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Conference_Location
Hohhot
Print_ISBN
978-1-4244-9436-1
Type
conf
DOI
10.1109/MACE.2011.5987086
Filename
5987086
Link To Document