• DocumentCode
    2794647
  • Title

    Scanning photocurrent microscopy in semiconducting carbon nanotube transistors

  • Author

    Ahn, Yeonghwan ; Park, Jiwoong

  • Author_Institution
    Division of Energy Systems Research, Ajou University, Suwon 443-749, Korea
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Scanning photocurrent measurements are demonstrated in individual carbon nanotube field effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.
  • Keywords
    Atomic force microscopy; CNTFETs; Carbon nanotubes; Electric variables measurement; Electrodes; FETs; Laser beams; Optical microscopy; Photoconductivity; Semiconductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2007. QELS '07
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/QELS.2007.4431777
  • Filename
    4431777
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2794647