• DocumentCode
    2796197
  • Title

    Establishment of the autoseparation method of thermally stimulated current curves and a new concept to support it

  • Author

    Maeta, Shigeyoshi ; Tanaka, Mitsuhiro ; Yasue, Youichi

  • Author_Institution
    Dept. of Electr. Eng., Osaka Inst. of Technol., Japan
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    1021
  • Abstract
    The slope estimation method II (SEM II), which enables one to determine strictly whether or not the thermally stimulated current (TSC) curve is ideal from moment to moment, has been derived from the concept of the `fundamental element´. As this method utilizes the differentiated quantities as the fundamental element, it shows very sensitively the flatness characteristic in the single carrier trap case, and it also shows the rapid fall-down characteristic in the critical situation, whereby the contribution from two carrier traps is detected. The thermal-cleaning technique is usually limited in its ability to make the objective clean, and it cannot basically separate unknown targets. The SEM II has clear standards. These standards enable one to detect the correct number of concealed carrier traps from the partial TSC curves. By utilizing the SEM II, multiple TSC curves having multiple carrier traps could be accurately separated and the single TSC curves could be individually established
  • Keywords
    curve fitting; electron traps; hole traps; thermally stimulated currents; autoseparation method; concealed carrier traps; critical situation; flatness characteristic; fundamental element; multiple TSC curves; multiple carrier traps; partial TSC curves; rapid fall-down characteristic; single carrier trap case; slope estimation method II; thermal-cleaning technique; thermally stimulated current curves; Cleaning; Crystalline materials; Crystals; Equations; Heating; Measurement standards; Numerical analysis; Organic materials; Temperature sensors; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172247
  • Filename
    172247