• DocumentCode
    2796722
  • Title

    Protective device placement for reliability improvement by considering anti-islanding protection of PV generation system

  • Author

    Jiravanstit, Nantipat ; Chaitusaney, Surachai

  • Author_Institution
    Chulalongkorn Univ., Bangkok, Thailand
  • fYear
    2012
  • fDate
    16-18 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    At present, the solar energy is a highly potential alternative for solving the energy crisis and improving system quality. On the other hand, the penetration of PVGS may cause an islanding problem. This paper derives Non Detection Zone (NDZ) of Over/Under voltage and Over/Under frequency method in order to increase accuracy for islanding prevention. In addition to safety issue, this paper proposes the protective device placement for system reliability improvement by using Genetic Algorithm (GA) optimization. The optimization also takes account of islanding prevention as constraint. The proposed method is brought to apply with Tasine 34-bus distribution system, and the simulation results are satisfactory.
  • Keywords
    distributed power generation; electrical safety; genetic algorithms; photovoltaic power systems; power generation protection; power generation reliability; GA optimization; NDZ; PV generation system; PVGS penetration; Tasine 34-bus distribution system; antiislanding protection; genetic algorithm; islanding prevention; nondetection zone; over-under voltage-over-under frequency method; protective device placement; reliability improvement; safety issue; solar energy; system quality improvement; Equations; Genetic algorithms; Load flow; Photovoltaic systems; Q factor; Relays; Reliability; Anti-islanding; Non detection zone (NDZ); Photovoltaic generation system (PVGS); Protective device; Recloser;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), 2012 9th International Conference on
  • Conference_Location
    Phetchaburi
  • Print_ISBN
    978-1-4673-2026-9
  • Type

    conf

  • DOI
    10.1109/ECTICon.2012.6254255
  • Filename
    6254255