• DocumentCode
    2796793
  • Title

    Lifetime estimates and unique failure mechanisms of the Digital Micromirror Device (DMD)

  • Author

    Douglass, M.R.

  • Author_Institution
    Texas Instrum. Inc., Plano, TX, USA
  • fYear
    1998
  • fDate
    March 31 1998-April 2 1998
  • Firstpage
    9
  • Lastpage
    16
  • Abstract
    The Digital Micromirror Device/sup TM/ (DMD/sup TM/) has made great strides in terms of both performance and reliability. Each device consists of more than 500,000 individually addressable micromirrors. Digital Light Processing/sup TM/ technology, based on the DMD, has been used in such diverse products as projection displays with film-like projected images and photographic-quality printers. Reliability testing of the DMD has demonstrated greater than 100,000 operating hours and more than 1 trillion mirror cycles. This paper discusses DMD reliability development activities, failure modes investigated (e.g. hinge fatigue, hinge memory, stuck mirrors, and environmental robustness), various acceleration techniques (e.g. temperature and duty cycle), corrective actions implemented, and the resulting evidence that the DMD is exceeding original reliability goals.
  • Keywords
    display instrumentation; environmental degradation; failure analysis; micromechanical devices; mirrors; optical information processing; reliability; 100000 hr; DMD; DMD reliability; Digital Light Processing technology; Digital Micromirror Device; acceleration techniques; duty cycle acceleration; environmental robustness; failure mechanisms; failure modes; film-like projected images; hinge fatigue; hinge memory; individually addressable micromirrors; lifetime estimates; mirror cycles; photographic-quality printers; projection displays; reliability; reliability testing; stuck mirrors; temperature acceleration; Displays; Failure analysis; Fasteners; Fatigue; Life estimation; Lifetime estimation; Micromirrors; Mirrors; Printers; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium Proceedings, 1998. 36th Annual. 1998 IEEE International
  • Conference_Location
    Reno, NV, USA
  • Print_ISBN
    0-7803-4400-6
  • Type

    conf

  • DOI
    10.1109/RELPHY.1998.670436
  • Filename
    670436