DocumentCode

2797765

Title

An automatic in-process microcircuit evaluation (aime) system

Author

Wildenberger, R.J. ; Dudziak, T.J. ; Kelly, J.F.

Author_Institution

RCA Corporation

fYear

1978

fDate

1978

Firstpage

251

Lastpage

256

Keywords

Assembly systems; Automatic testing; Circuits; Costs; Inspection; Microscopy; Military computing; Printing; Substrates; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '78. International Automatic Testing Conference

Type

conf

DOI

10.1109/AUTEST.1978.764375

Filename

764375