DocumentCode
2798194
Title
Statistical design in integrated optics
Author
Melloni, Andrea ; Roncelli, Davide ; Morichetti, Francesco ; Canciamilla, Antonio ; Bakker, Arjen
Author_Institution
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
fYear
2009
fDate
14-19 June 2009
Firstpage
1
Lastpage
1
Abstract
The ´design on tolerance´ concept in integrated optic is introduced. The aim of this technique is to design a circuit that is robust to statistical variations of the parameters due to technological processes and aging. The numerical technique permits to design a generic circuit that maximizes the yield of the production process and at the same time locates the most critical parameters of the circuit.
Keywords
integrated circuit design; integrated optics; statistical analysis; generic circuit design; integrated optics; production process; statistical variations; Circuit simulation; Design optimization; Electromagnetic modeling; Integrated circuit technology; Integrated circuit yield; Integrated optics; Optical design; Optical filters; Optical scattering; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location
Munich
Print_ISBN
978-1-4244-4079-5
Electronic_ISBN
978-1-4244-4080-1
Type
conf
DOI
10.1109/CLEOE-EQEC.2009.5192739
Filename
5192739
Link To Document