• DocumentCode
    2798665
  • Title

    Estimation of internal junction temperature & thermal resistance of light-emitting diodes using external luminous flux measurements

  • Author

    Tao, X.H. ; Li, S.N. ; Hui, S.Y.R.

  • Author_Institution
    Centre for Power Electron., City Univ. of Hong Kong, Hong Kong, China
  • fYear
    2010
  • fDate
    12-16 Sept. 2010
  • Firstpage
    179
  • Lastpage
    183
  • Abstract
    Although critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. From the general photo-electro-thermal theory for LED systems, new equations for estimating the internal junction temperature Tj and junction-case thermal resistance Rjc of LED from the luminous flux measurements, which can be obtained relatively easily, are presented and verified practically. These equations provide a valuable tool for checking Tj in LED system design without expensive equipment.
  • Keywords
    LED displays; LED lamps; photometry; thermal resistance; LED internal junction temperature estimation; LED thermal resistance; external luminous flux measurements; light emitting diodes; photoelectrothermal theory; Electrical resistance measurement; Heating; Junctions; Light emitting diodes; Power measurement; Temperature measurement; Thermal resistance; LED system theory; Light-emitting diodes; lighting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-5286-6
  • Electronic_ISBN
    978-1-4244-5287-3
  • Type

    conf

  • DOI
    10.1109/ECCE.2010.5618051
  • Filename
    5618051
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2798665