DocumentCode
2802536
Title
A thermal evaluation of multichip module (MCM) materials and designs
Author
Kuhlman, Mark A. ; Sehitoglu, Hasan
Author_Institution
Rockwell Int., Anaheim, CA, USA
fYear
1992
fDate
3-5 Feb 1992
Firstpage
110
Lastpage
118
Abstract
The authors discuss the thermal performance of multichip module (MCM) materials and designs. Particular emphasis is placed on the effects of polyimide lamination and various substrate materials. Because of the thermal characteristics of these new materials and designs selected in MCMs, a thermal study was performed comparing various assembly techniques and substrate materials available. Initial modeling was done comparing the heat removed from an MCM die by conduction, convection, and radiation. Wire bond, tape automated bonding, and flip-chip attachment were compared. Subsequent modeling was performed to more accurately predict heat removed by conduction. Test circuits were built to evaluate the thermal performance of alternate substrate materials and to verify the accuracy of previous conduction models
Keywords
flip-chip devices; heat transfer; modules; packaging; substrates; tape automated bonding; thermal analysis; thermal resistance; MCM die; MCM materials; assembly techniques; conduction; convection; flip-chip attachment; heat removal; modeling; multichip module; polyimide lamination; radiation; substrate materials; tape automated bonding; thermal evaluation; thermal performance; wire bond; Assembly; Bonding; Circuit testing; Conducting materials; Lamination; Materials testing; Multichip modules; Polyimides; Predictive models; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
Conference_Location
Austin, TX
Print_ISBN
0-7803-0500-0
Type
conf
DOI
10.1109/STHERM.1992.172858
Filename
172858
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