• DocumentCode
    2802536
  • Title

    A thermal evaluation of multichip module (MCM) materials and designs

  • Author

    Kuhlman, Mark A. ; Sehitoglu, Hasan

  • Author_Institution
    Rockwell Int., Anaheim, CA, USA
  • fYear
    1992
  • fDate
    3-5 Feb 1992
  • Firstpage
    110
  • Lastpage
    118
  • Abstract
    The authors discuss the thermal performance of multichip module (MCM) materials and designs. Particular emphasis is placed on the effects of polyimide lamination and various substrate materials. Because of the thermal characteristics of these new materials and designs selected in MCMs, a thermal study was performed comparing various assembly techniques and substrate materials available. Initial modeling was done comparing the heat removed from an MCM die by conduction, convection, and radiation. Wire bond, tape automated bonding, and flip-chip attachment were compared. Subsequent modeling was performed to more accurately predict heat removed by conduction. Test circuits were built to evaluate the thermal performance of alternate substrate materials and to verify the accuracy of previous conduction models
  • Keywords
    flip-chip devices; heat transfer; modules; packaging; substrates; tape automated bonding; thermal analysis; thermal resistance; MCM die; MCM materials; assembly techniques; conduction; convection; flip-chip attachment; heat removal; modeling; multichip module; polyimide lamination; radiation; substrate materials; tape automated bonding; thermal evaluation; thermal performance; wire bond; Assembly; Bonding; Circuit testing; Conducting materials; Lamination; Materials testing; Multichip modules; Polyimides; Predictive models; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0500-0
  • Type

    conf

  • DOI
    10.1109/STHERM.1992.172858
  • Filename
    172858