• DocumentCode
    2803009
  • Title

    Power Aware Shift and Capture ATPG Methodology for Low Power Designs

  • Author

    Khullar, Shray ; Bahl, Swapnil

  • Author_Institution
    Technol. R&D, STMicroelectron., Noida, India
  • fYear
    2011
  • fDate
    20-23 Nov. 2011
  • Firstpage
    500
  • Lastpage
    505
  • Abstract
    Power management has emerged as a major design objective, both in functional and test mode, in most of the application domains that employ digital ICs. This paper presents a low power ATPG methodology for managing power both in shift and capture mode. The technique exploits the embedded clock gates and provides a good tradeoff between pattern count and reduction in switching activity without any significant coverage loss. The methodology also presents a novel method of selective scan chain reordering for scan compressed designs to reduce shift switching activity with minimal design flow constraints.
  • Keywords
    automatic test pattern generation; digital integrated circuits; ATPG methodology; clock gates; digital IC; low power designs; minimal design flow; power aware shift; shift switching activity reduction; test mode; Automatic test pattern generation; Clocks; Correlation; Logic gates; Power demand; Switches; Vectors; capture power; low power; scan reordering; shift power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2011 20th Asian
  • Conference_Location
    New Delhi
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4577-1984-4
  • Type

    conf

  • DOI
    10.1109/ATS.2011.65
  • Filename
    6114725