DocumentCode
2803009
Title
Power Aware Shift and Capture ATPG Methodology for Low Power Designs
Author
Khullar, Shray ; Bahl, Swapnil
Author_Institution
Technol. R&D, STMicroelectron., Noida, India
fYear
2011
fDate
20-23 Nov. 2011
Firstpage
500
Lastpage
505
Abstract
Power management has emerged as a major design objective, both in functional and test mode, in most of the application domains that employ digital ICs. This paper presents a low power ATPG methodology for managing power both in shift and capture mode. The technique exploits the embedded clock gates and provides a good tradeoff between pattern count and reduction in switching activity without any significant coverage loss. The methodology also presents a novel method of selective scan chain reordering for scan compressed designs to reduce shift switching activity with minimal design flow constraints.
Keywords
automatic test pattern generation; digital integrated circuits; ATPG methodology; clock gates; digital IC; low power designs; minimal design flow; power aware shift; shift switching activity reduction; test mode; Automatic test pattern generation; Clocks; Correlation; Logic gates; Power demand; Switches; Vectors; capture power; low power; scan reordering; shift power;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2011 20th Asian
Conference_Location
New Delhi
ISSN
1081-7735
Print_ISBN
978-1-4577-1984-4
Type
conf
DOI
10.1109/ATS.2011.65
Filename
6114725
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