• DocumentCode
    2803971
  • Title

    A Fourier-based method for detecting curved microtubule centers: Application to straightening of cryo-electron microscope images

  • Author

    Blestel, S. ; Kervrann, C. ; Chrétien, D.

  • Author_Institution
    Centre de Rennes Bretagne Atlantique, Univ. Rennes I, Rennes, France
  • fYear
    2009
  • fDate
    June 28 2009-July 1 2009
  • Firstpage
    298
  • Lastpage
    301
  • Abstract
    In this paper, we propose two sensitive contributions to automatically determine the local orientations and centers of short segments of microtubules in cryo-electron microscope images. Indeed, to our knowledge, the methods to determine the local centers of helices are not relevant for non centro-symmetric helices (e.g. 13-protofilament microtubules). The proposed algorithm exploits the helical symmetry of microtubules and the corresponding properties in the Fourier domain, so it can be easily extended to process other helical objects. Experimental results demonstrate that center locations are estimated with an accuracy of lower than one pixel. We applied the algorithm to automatically straighten images of curved microtubules with odd numbers of protofilaments, and to improve 3D reconstructions of microtubules using back-projection methods.
  • Keywords
    Fourier transforms; backpropagation; biomedical optical imaging; biothermics; image reconstruction; image segmentation; medical image processing; optical microscopy; 3D image reconstruction; Fourier-based method; back-projection method; cryo-electron microscope images; curved microtubule detection; non centro-symmetric helices; Assembly; Biological cells; Biomedical imaging; Cells (biology); Fourier transforms; Image analysis; Image reconstruction; Image segmentation; Microscopy; Packaging; Bessel functions; Fourier transforms; cryo-electron microscopy; image orientation analysis; microtubules;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-3931-7
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2009.5193043
  • Filename
    5193043